The IR-BZ series has a compact detector by structure the detector from the main body, making it possible to use it in high temperature environments. It is equipped with a digital temperature display and parameter setting function to achieve stable measurement.
It can be used in low to high temperature environments of -10 to 100°C, with measuring objects of 0 to 1000°C. The detector and main unit are separate, allowing for space-saving installation.
Model | For high temperatures |
---|---|
Models | IR-BZP |
Detecting element | Thermopile |
Wavelength | 8~14μm |
Measurement temperature range | 0~1000℃ |
Accuracy ratings | Under 300℃: ±3.0℃ 300℃ or higher: 1.0% of measured value |
Repeatability | ±0.5℃ or ±0.5% of measured value |
Resolution | 2℃ |
Response time | 15ms |
Measurement diameter/measurement distance | φ8/200mm |
Output Signal | current or thermocouple output |
Communication interface | RS-485 |
Power supply | 8 to 36V DC |
Power consumption | Maximum 1.5VA |
External dimensions | W80xH70xD30mm (main body) |
Weight | Approx. 450g (main body) |
Others | CE marking |
This is a product selection guide for Chino radiation thermometer.
We offer products related to "temperature measurement and control" in the semiconductor front-end process, as well as system proposals that combine these products.
We will introduce solutions related to temperature measurement and control in process of "ingot pulling," "wafer polishing/oxidation," "etching," and "film formation," as well as "superconductivity," "artificial diamond," and "thermography that can withstand temperatures up to 150°C."
The IR-BZP has a separate detection section, making it compact and fair. With improved heat resistance, it is a compact radiation thermometer that is ideal for incorporating into equipment.
IR-BZP
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